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Beyond touch-based HMI: Control your machines in natural language by utilizing large language models and OPC UA

arXiv.org Artificial Intelligence

This paper proposes an agent-based approach toward a more natural interface between humans and machines. Large language models equipped with tools and the communication standard OPC UA are utilized to control machines in natural language. Instead of touch interaction, which is currently the state-of-the-art medium for interaction in operations, the proposed approach enables operators to talk or text with machines. This allows commands such as 'Please decrease the temperature by 20 % in machine 1 and set the motor speed to 5000 rpm in machine 2.' The large language model receives the user input and selects one of three predefined tools that connect to an OPC UA server and either change or read the value of a node. Afterwards, the result of the tool execution is passed back to the language model, which then provides a final response to the user. The approach is universally designed and can therefore be applied to any machine that supports the OPC UA standard. The large language model is neither fine-tuned nor requires training data, only the relevant machine credentials and a parameter dictionary are included within the system prompt. The approach is evaluated on a Siemens S7-1500 programmable logic controller with four machine parameters in a case study of fifty synthetically generated commands on five different models. The results demonstrate high success rate, with proprietary GPT 5 models achieving accuracies between 96.0 % and 98.0 %, and open-weight models reaching up to 90.0 %. The proposed approach of this empirical study contributes to advancing natural interaction in industrial human-machine interfaces.


Learning Actionable World Models for Industrial Process Control

arXiv.org Artificial Intelligence

To go from (passive) process monitoring to active process control, an effective AI system must learn about the behavior of the complex system from very limited training data, forming an ad-hoc digital twin with respect to process in- and outputs that captures the consequences of actions on the process's world. We propose a novel methodology based on learning world models that disentangles process parameters in the learned latent representation, allowing for fine-grained control. Representation learning is driven by the latent factors that influence the processes through contrastive learning within a joint embedding predictive architecture. This makes changes in representations predictable from changes in inputs and vice versa, facilitating interpretability of key factors responsible for process variations, paving the way for effective control actions to keep the process within operational bounds. The effectiveness of our method is validated on the example of plastic injection molding, demonstrating practical relevance in proposing specific control actions for a notoriously unstable process.


Harnessing Machine Learning for Single-Shot Measurement of Free Electron Laser Pulse Power

arXiv.org Artificial Intelligence

Electron beam accelerators are essential in many scientific and technological fields. Their operation relies heavily on the stability and precision of the electron beam. Traditional diagnostic techniques encounter difficulties in addressing the complex and dynamic nature of electron beams. Particularly in the context of free-electron lasers (FELs), it is fundamentally impossible to measure the lasing-on and lasingoff electron power profiles for a single electron bunch. This is a crucial hurdle in the exact reconstruction of the photon pulse profile. To overcome this hurdle, we developed a machine learning model that predicts the temporal power profile of the electron bunch in the lasing-off regime using machine parameters that can be obtained when lasing is on. The model was statistically validated and showed superior predictions compared to the state-of-the-art batch calibrations. The work we present here is a critical element for a virtual pulse reconstruction diagnostic (VPRD) tool designed to reconstruct the power profile of individual photon pulses without requiring repeated measurements in the lasing-off regime. This promises to significantly enhance the diagnostic capabilities in FELs at large.